Equipment

Collaborative Access Center "Testing Center of Nanotechnology and Advanced Materials"

Центр коллективного доступа «Испытательный центр нанотехнологий и перспективных материалов» вырабатывает комплексный подход к решению задач фундаментальной и прикладной науки. Имеющийся комплекс современного оборудования позволяет получать количественную информацию о химическом и фазовом составе, параметрах кристаллов, электронном и магнитном строении, механических свойствах, типе и концентрации дефектов. В Центре установлено следующее уникальное оборудование:  

Трансмиссионные электронные микроскопы


 

Transmission electron microscope JEM-200CX («JEOL Ltd», Japan), 1984

 

Designed to study with high spatial resolution the atomic-crystalline and amorphous structure of any objects of inorganic, organic, metallic, ceramic, and biological types. The microscope is equipped with an attachment for in situ cooling of samples in the column of the microscope.

 

Principal technical characteristics:

  • accelerating voltage                      up to 200 kV
  • magnification                                up to ×650,000
  • point-by-point resolution             0.30 nm
  • line-by-line resolution        0.14 nm

 

 

Transmission electron microscope Tecnai G2 30 Twin ("FEI", The Netherlands), 2005

 

Designed to study the atomic-crystalline and amorphous structure of inorganic, organic, metallic, ceramic, and biological objects, with high spatial resolution up to atomic one. The microscope is equipped with electron beam scanning systems, "GATAN" image mapping, electron energy loss spectroscopy "EELS" unit, and the "EDAX" energy dispersion spectrometer for chemical elemental analysis. It is also equipped with a set of units for in situ heating, cooling, and deformation.

 

Principal technical characteristics:

  • accelerating voltage                                 up to 300 kV
  • magnification                                            up to ×1 000, 000
  • point-by-point resolution                         0.20 nm
  • line-by-line resolution                              0.14 nm
  • energy resolution of the EDAX spectrometer       160 eV
  • lateral resolution in the elemental analysis mode 1.6 nm

 

 

СМ-30 SuperTwin («FEI», Нидерланды), 2004 г.

 

Предназначен для исследования атомно-кристаллической и аморфной структуры любых объектов (неорганических, органических, металлических, керамических, биологических) с высоким разрешением вплоть до атомного. Оборудован системой сканирования и энергодисперсионным спектрометром «EDAX» для элементного анализа.
    
 
Основные характеристики:
  • ускоряющее напряжение                       до 300 кВ
  • увеличение                                           до 750 тыс. крат
  • разрешение по точкам                           0,20 нм
  • разрешение по линиям                          0,14 нм
  • разрешение EDAX спектрометра           160 эВ

Scanning electron microscope

Scanning electron microscope QUANTA 200 Pegasus ("FEI", The Netherlands), 2005

 

Designed for studies of microstructure, texture, phase- and chemical elemental composition, and fractography of inorganic and organic objects, including living ones, with high spatial resolution. It is equipped with the PEGASUS system (sample imaging with backscattered and secondary electrons, characteristic X-ray radiation), with an EDAX energy dispersion spectrometer for elemental analysis, and an EBSD system for structural and texture analysis. Operates using three vacuum modes, including operation in a gas-vapor environment for living objects, investigations of non-conducting samples, and corrosion resistance studies.

 

Principal technical characteristics:

  • accelerating voltage                      up to 30 kV
  • magnification                                from ×20 to ×160,000
  • point-by-point resolution             5 nm
  • energy resolution of the EDAX spectrometer       160 eV

 

Scanning electron microscope Tescan MIRA LMS (Tescan Brno s.r.o., Czech Republic), 2021

 

4th generation Scanning Electron Microscope with FEG Schottky electron emission source combines SEM imaging and live chemical elemental composition analysis. Designed for the study of various materials in a solid-phase state, both monolithic and in the form of powders of any dispersion and agglomeration (including studies via operation in a gas-vapor medium for living objects, for non-conducting samples and corrosion resistance studies), using imaging methods (modes of secondary and backscattered electrons), including fractography of the fractured surfaces, energy dispersive elemental analysis and orientation analysis based on backscattered electron patterns (EBSD analysis).

 

Principal technical characteristics:

  • accelerating voltage                        up to 30 kV
  • magnification                                  from ×20 to ×160,000
  • point-by-point resolution                1.2 nm
  • energy resolution of the EDAX spectrometer          160 eV

 

 

A sample preparation equipment
 
 

Manual grinding and polishing machine (MetaServ 250) with Semi-automatic Unit (Vector LC 250)

 

Purpose: Manual (without Vector LC 250) and semi-automatic (using Vector LC 250) preparation of samples for transmission, scanning, or optical microscopy.

 

Principal characteristics:

  • Diameter of polishing circle: 10"(254 mm).
  • Adjustable rotation speed of polishing circle: from 50 to 500 rpm.
  • Built-in electronic timer for setting different duration of the grinding/polishing cycle with automatic shutdown of the wheel rotation or water supply.
  • Water supply rate: 2 liters/min
  • The Vector LC 250 semi-automatic unit provides simultaneous processing from one to four samples with a diameter of up to 25 mm with an individual load of up to 50N per sample.
  • Sample holder rotation speed: 60 rpm.

 

 

 

 

 

Model 1010 Ion Mill

 

Purpose: precision ion milling and polishing of samples for further investigation by transmission electron microscopy.

 

Principal characteristics:

  • Etching is carried out in an argon atmosphere.
  • Etching angle range: from 0° to 45°.
  • Ion source current range: 3 – 8 mA.
  • Current density: 400 microamps/cm2.
  • The voltage range of the ion source: 1-6 kV.

 

 

 

Model 200 Pits Grinder

 

Purpose: mechanical grinding of samples for subsequent preparation by ion milling.

 

Principal characteristics:

  • Various grinding options are available: flat grinding, pit grinding, polishing.
  • Thinning of the sample to a thickness of the order of several micrometers.
 
 

 

 


 

Model 170 Ultrasonic Disk Cutter

 

Purpose: ultrasonic cutting of hard and brittle materials.

 

Principal characteristics:

  • Possibility of treatment of samples of various shapes (discs, rods, rectangular plates) from billets with a thickness of 10 micrometers to 10 mm.
  • Cutting tools: discs with a diameter of 3.0 mm and 2.3 mm, rectangular plates with dimensions of 2 mm x 3 mm.

Magnetic measurement equipment​

 

SQUID Magnetometer (Quantum Design, USA): Magnetic Property Measurement System – MPMS-XL-5

 

The device is designed to measure the magnetic characteristics (magnetization and magnetic susceptibility) of samples with small values ​​of the magnetic moment. The device has the ability to measure the magnetic moment of all types of materials, namely single crystals, polycrystalline samples, thin films, powders, etc. The real (m') and imaginary (m'') components of the dynamic (AC) susceptibility are measured.

 

Principal characteristics:

  • Magnetic field:                                       50 kOe
  • Magnetic Moment range:                      10-8 - 300 Gs•cm3
  • Temperature Range (magnetometry):   1.8 - 400 K
  • AC Susceptibility; Frequency Range:    0.01 – 1000 Hz
     

 

 

 

Physical Property Measurement System PPMS-9 (Quantum Design, USA)

 

  • 90 kOe Magnet
  • Temperature Range 2 – 400 K
  • Temperature Range (magnetometry): 2 – 350 K

Magnetometry

  • Magnetic Moment range ~10-5 - 10 EMU (Gs•cm3)
  • AC Susceptibility; Frequency Range – 10 – 10000 Hz, sensitivity of 2 x 10-8 EMU

DC Resistivity

  • Current Range of 5 nA to 5 mA
  • 20 nV sensitivity

AC Transport

  • Current Range of 10 μA to 2 A
  • Frequency Range of 1 Hz to 1 kHz

Heat Capacity

  • Samples ~ 20 mg
  • Resolution of ~10 nJ/K at 2 K
 
 

 

 

 

Vibrating sample magnetometer 7407 VSM based on water-cooled electromagnet

 

The vibrating sample magnetometer 7407 VSM is to carry magnetic measurements of bulk, powder, and film samples

Manufacturer: Lake Shore Cryotronics, USA
Production year: 2012

Main characteristics:

  • Sensitivity: up to 10–7 emu.
  • Magnetic moment measurement range: from 10–7 to 400 emu with relative error less than 1%.
  • Temperature range: from 5.5 to 1273 K.
  • Magnetic field strength: up to 23 kOe.
  • Vibration frequency: 82 Hz.
  • Vibration amplitude 1.5 mm.

 

 

 

 

 

 

Oxford Instruments system with He3 unit (Great Britain, 1998).

 

Designed to study galvanomagnetic phenomena in strong magnetic fields and at ultralow temperatures using dc methods (Hall effect in bulk samples and heterostructures, electrical conductivity, current-voltage characteristic, temperature dependences of resistance)

 

Principal characteristics:

  • magnetic field                                                                          up to 13 Tesla
  • probing current                                                                        up to 100mA
  • temperature range                                                                  from 0.3К to 400 K
 

 

 

 

Experimental isetup for measurements in high pulsed magnetic fields

 

Main characteristics:

  • Measurement of the field dependence of the magnetic moment
  • Measurement of the field dependence of the first and second derivatives of magnetization
  • Maximum magnetic field – up to 36 Tesla (360 kOe)
  • Temperature range (4.2 - 320) K
  • Bi- and unipolar impulses
  • Pulse duration 8 ms

 

 

 

Электронные супермикровесы «Sartorius SE 2» («Sartorius», Германия)

 

Предназначены для высокоточного взвешивания проб.

 
Основные характеристики: 
  • дискретность - 0,0001 мг; 
  • наибольший предел взвешивания (НПВ) - 2,1 г.; 
  • класс точности - I; 
  • встроенная калибровка.

 
 

Mechanical testing installations

 

"NanoTest-600" ("Micro Materials Ltd", UK), 2009

 

The unit is designed to measure mechanical properties at the nanoscale. It is equipped with an automated three-coordinate sample platform with a system for eliminating engine backlash to ensure high reproducibility of positioning.

It permits to determine mechanical properties, such as the hardness of the material under study, the hardness of coatings (as well as their thickness), the modulus of elasticity, the temperature characteristics of the material (in air, up to about +300 ° C).

 

Main Features:

  • The range of movement along the X-Y-Z axes                         50x50x50 mm
  • X-Y-Z axis movement resolution                                                0.05 micrometers

The indentation node:

  • Discreteness of the load setting in the range of 0-0.5 N             0.01mN
  • Maximum measured depth at loads up to 0.5 N                          16 micrometers
  • Noise level (in depth) at minimum loads                                          +/-1nm

 

 

 

Testing machine «Instron 5982» 
Manufacturer: Instron, UK
Year of fabrication: 2010

Designed for measuring mechanical properties when testing for tension, compression, three-point bending.

Principal characteristics:

  • maximum load 100 kN (10 tf);
  • load measurement error in the range from 400 N to 100 kN +/- 0.5% of the measured value;
  • deformation measurement error using an extensometer +/-0.5% of the measured value, with a value of more than 1/50 of the maximum value of the extensometer scale. (Extensometers available for testing at room temperature only);
  • test speed from 0.005 to 500 mm/min;
  • temperature range from -150 to +1000 ºС;
  • test area: height 1430 mm, width 575 mm.

 

 

 

AIMA-5-2 machines (“ZIP”, Ivanovo, Russia, 1979) for testing creep and long-term strength in air at temperatures up to 1000°C and loads from 0.05 to 30kN. Temperature stability +/-3°C.

 

 

Laboratory furnaces "PM-1.0-7" (muffle), and "PKL-1.2-12" (chamber) (NPP "Teplopribor", Russia, 2004) for long-term annealing in air at temperatures up to 1000°C (furnace PM-1.0-7, working volume 180x150x290 mm3), and up to 1200°C (furnace PKL-1.2-12, working volume 180x190x300 mm3).

 

 

 

Setup for determining resistance to stress corrosion cracking in aggressive environments.

 

Hardness testing Qness Q10A+

Manufacturer: Qness GmbH Austria
Year of manufacture: 2021

Detailed information​:

  • test force range: 0,00245 до 98,07 N (0,00025-10 kg);
  • test methods: Vickers, Knoop;
  • rotatable Knoop indenter;
  • motorized test anvil with traveling distance 150х150 mm;
  • XY positioning repeatability 1 µm;
  • test height 140mm;
  • motorized Tool Changer with 6 tool positions;
  • max. 3 hardness testing modules;
  • 4х, 10х, 20х, 40х, 65х magnification lenses;
  • fully automated, unmanned test and analysis cycles;
  • test head control: dynamic, 3-axis-joystick automated (CAS technic).

 

 

 

Monocrystal diffractometer XtaLAB Synergy-S

The XtaLAB Synergy-S monocrystal diffractometer with microfocus X-ray sources is designed for diffraction experiments with single crystals of chemical substances (inorganic, organic or organo-metallic), mineralogical and biological samples. The experimental data are used to determine the atomic structure of crystals (unit cell parameters, spatial symmetry, atomic coordinates, atomic thermal oscillation parameters, electron density distribution) over a wide temperature range.

Manufactured by Rigaku Oxford Diffraction, Japan.
Year of production: 2021
 

Device specifications:

  • Dual Photon Jet-S microfocus source (Cu, Mo);
  • Four-circle Kappa geometry goniometer with telescopic mount 2 theta;
  • Oxford Cryosystems Cryostream (800 Series) temperature control system with integrated level and fill monitoring module;
  • Temperature measurement range 80-500 K;
  • Fast and efficient collection of data from unstable samples;
  • Structure determination of extremely small crystals (0.02 * 0.02 * 0.02 mm);
  • Studying the electron density distribution;
  • HyPix 6000 detector that allows the study of crystals with weak diffraction without loss of data quality due to detector noise.​

 

Pendulum pile driver IO 5003-0,3-11 type

 

Designed for testing samples of metals and alloys for double-support impact bending in accordance with GOST (state russian standard) 9454-78.
 

Principal characteristics:

  • type of pile driver: pendulum
  • type of tests: two-support shock bending (Sharpie method)
  • nominal values of the potential energy of the pendulums: 150; 300; 450 Joules
  • pendulum lifting device type: pneumatic drive
  • the speed of the pendulum at the moment of impact: 5 m/s
  • total weight: less than 750 kg
  • temperature range: from -82 to +102 °C (with liquid cryothermostat)

 
Liquid cryothermostat
 

Principal characteristics:

  • temperature range: from -82 to +102 °C
  • temperature gradient: less than 0.01°C/cm
  • power consumption: less than 2200 W

 

 Spectrophotometer UV-mini-1240  («Shimadzu», Japan)

Designed to determine the spectral composition of substances 
Manufacturer: Shimadzu, Japan 
Year of production: 2005

Principal characteristics: 

  • Spectral range: from 190.0 to 1100.0 nm;
  • Spectral transmittances measurement range: from 0 to 100%;
  • Wavelength scale error: ± 1.0 nm;
  • Transmittance absolute error: ± 1%.

Modes of operation: 

  • measurement of optical density or transmission, determination of concentration by the K-factor method;
  • scanning along a wavelength with the possibility of subsequent processing of the spectrum;
  • creation of a calibration curve and calculation of equations of the 1-3 order using the measured standards (from 2 to 10) or entered values;
  • determination of concentrations of samples with unknown composition.

 

 

Parallel optical spectrometer with inductively coupled plasma (ICP) ICPE9000


 
Vacuum ICP spectrometer with temperature-controlled Echelle optics. Provides qualitative and precise quantitative analysis without pre-setting the analytical lines. 
Manufacturer: Shimadzu, Japan 
Year of fabrication: 2012                                                  
 
Principal characteristics: 
  • spectral range 167~800nm; 
  • provides determination of most chemical elements at the level of 1-10 ppb; 
  • inearity range within 5-6 orders of magnitude. 
The powerful ICPsolution software provides: 
  • fast and reliable qualitative analysis using the built-in database of wavelengths and spectral influences for all chemical elements with automatic selection of wavelengths least subjected to spectral artifacts; 
  • assessment of concentration ranges of determined and accompanying elements, automatic selection of correction methods; 
  • determination of the composition of the sample for calibration; 
  • automatic selection of one, the most optimal analysis result among the data obtained during measurements at different wavelengths; 
  • diagnostics of the nature of influences of various factors; 
  • quantitative analysis: reliable determination of even difficult-to-detect elements in samples with complicated composition.

 

 

LHe18 installations to produce liquid helium (Cryomech Inc, США) 2010 г.

 

 

Предназначена для получения жидкого гелия.

 
Основные характеристики:
  • скорость производства жидкого гелия      0,75 л/ч (18 л в сутки)
  • время выхода на рабочий режим             <36 ч
  • емкость накопительного гелиевого сосуда  150 л
  • мощность                                                9,2 кВт
  • масса                                                      463 кг
 
 
 
Combined thermal analyzer STA 449 F3 Jupiter
 
Combined thermal TG, TGA-DTA and TGA-DSC analyzer. Permits to record simultaneously variation of mass of a sample and the processes accompanied by the release or absorption of heat. Principle of operation: measurement of sample mass variation with temperature or composition of gas environment.
Manufactured by: Netzsch, Germany
Year of production: 2019
 

Techical characteristics:

  • Working temperatures - till 1500°С.
  • Heating rate to  1200°C - from 0.1 to 50°C/ min.
  • Heating rate to  1500°C - from 0.1 to 20°C/ min.
  • Cooling rate of the furnace  - from 0 to 50°C/ min.
  • Sample mass – up to 200 mg (35 g with sample golder).
  • Mass resolution within the whole range  - 1 mkg.
  • Calorimetric accuracy/reproducibility - ± 2% (using metallic standard).
  • Sensitivity for DSC signal – 1 mkW.
  • Range of flux of purge gas - from 5 to 250 ml/min.
  • Purge gases – argon, nitrogen, air.
  • Thermocouples  - Pt / Pt-Rh (R-type).
  • Crucibles: platinum: 40 mkl, 110 mkl; ceramic (Al2O3): 85 mkl.

Application areas determination of temperature intervals of phase transitions of the first and second kind; melting, crystallization, polymorphic transformation, vitrification, ordering; enthalpies of various transitions; specific heat capacity; construction of phase diagrams; analysis of decomposition, combustion, oxidation, evaporation processes, kinetics of reactions, degree of crystallinity, determination of material purity.